The effect of laser radiation on a junction field-effect transistor

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Abstract

Experimental and theoretical studies of the effect of modulated laser radiation on the functioning of a junction field-effect transistor (JFET) as part of an amplifier stage with a common source have been carried out. Patterns in changes in transistor parameters depending on external radiation are determined. It has been established that the cut-off voltage and the specific steepness of the shutter undergo the greatest changes during laser irradiation. It was found that when the transistor structure is irradiated, a photovoltaic effect occurs at the p-n junction of the gate, the concentration of free charge carriers in the semiconductor regions and the channel resistance change. It is shown that the device is sufficiently resistant to laser radiation, which is crucial for creating radiation-resistant integrated circuits.

About the authors

S. Sh. Rekhviashvili

KBSC RAS

Author for correspondence.
Email: rsergo@mail.ru

Institute of Applied Mathematics and Automation

Russian Federation, 89A Shortanova St., Nalchik, 360000

D. S. Gaev

Kabardino-Balkarian State University named after Kh.M. Berbekov

Email: rsergo@mail.ru
Russian Federation, 173 Chernyshevsky St., Nalchik, 360004

А. B. Litvinov

KBSC RAS

Email: rsergo@mail.ru

Institute of Applied Mathematics and Automation

Russian Federation, 89A Shortanova St., Nalchik, 360000

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