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Mikroèlektronika
ISSN 0544-1269 (Print)
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Keywords Förster effect bipolar transistor diagnostics etching gas temperature ionization kinetics magnetron sputtering mechanism memristor modeling molecular beam epitaxy plasma polymerization powerful LDMOS quantum dot reduced electric field strength resistive switching silicon silicon-on-insulator technology specific power
Current Issue

Vol 54, No 4 (2025)

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Keywords Förster effect bipolar transistor diagnostics etching gas temperature ionization kinetics magnetron sputtering mechanism memristor modeling molecular beam epitaxy plasma polymerization powerful LDMOS quantum dot reduced electric field strength resistive switching silicon silicon-on-insulator technology specific power
Current Issue

Vol 54, No 4 (2025)

Home > Search > Author Details

Author Details

Kerimov, E. A.

Issue Section Title File
Vol 53, No 4 (2024) TECHNOLOGIES Methodology of Production of Photo-Sensitive Elements on Ptsi Basis
Vol 52, No 2 (2023) TECHNOLOGIES Investigation of the Optical Properties of Ultrathin Films Based on Metal Silicide
Vol 52, No 1 (2023) INSTRUMENTATION Study of Photodetectors with Schottky Barriers Based on the IrSi–Si Contact
Vol 53, No 6 (2024) TECHNOLOGIES Conductivity Study of Carbon Nanotubes Deposited on Iridium Silicon-Silicide Substrate
 

 

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